Scanning electron microscope (SEM) is an electron microscope which is designed for directly studying the surfaces of solid objects, that utilizes a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. Scanning Electron Microscope (SEM) of the Department of Mechanical Engineering using the latest machine produced by HITACHI (HITACHI FLEXSEM 100) for analysis surface topology and morphology of a tested sample. The microscope is equipped by Ultra Variable Pressure Detector for analyzing both non-conductive and conductive materials, Moreover, this equipment also equipped with Dispersive Energy X-Ray Spectroscopy (EDS) to find out a composed element of a tested-sample. EDS can be used in small areas (dots), lines and boxes. Besides that, EDS can be used to find out the distribution (mapping) of elements in the tested sample.

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